Schimpf, S. & Beucker, S. (2006). An ICT-Supported Methodology for Expert Identification in the Technology Monitoring Process. In, P. Cunningham & M. Cunningham (Eds.), Exploiting the Knowledge Economy: Issues, Applications and Case Studies (S. 1284–1289). Amsterdam, Netherlands; Washington, DC: IOS Press.
In early innovation phases expert knowledge is often crucial to identify specific properties, characteristics and developments of technological components and their applications. This is particularly true in the field of complex high tech innovations that require knowledge from various domains. The article describes an ICT-supported approach that allows the identification of experts. An ontology is used to identify the key words for the search and is combined with semantic search for the identification of technology experts in defined information sources such as scientific libraries and patent information.Ansehen